Metallurgical Engineering > GATE 2019 > Electron Microscopy
In a typical scanning electron microscope (SEM) image, information about topography and atomic contrast are obtained from _______.
A
secondary electron and auger electron, respectively.
B
primary electron and secondary electron, respectively.
C
secondary electron and back-scatter electron, respectively.
D
back-scatter electron and auger electron, respectively.

Correct : c

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